Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways
نویسندگان
چکیده
منابع مشابه
Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways
Quantitative intensity and distance measurements in atomically resolved scanning transmission electron microscopy (STEM) imaging relies on the precision of the intensity and position of the images corresponding to the scanned sample area. Conventional STEM rastering modes are limited by drift distortion in the slow scan direction. It has been realized that the scan direction is a parameter that...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2016
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927616005341